JEOL JXA-840A Xray Volt Scanning Electron Probe 1-4K 30-ANGSTROM Microanalyzer

( Brand: Jeol ), ( Manufacturer Part Number: JXA-840A ), ( Part Type: Probe ), ( Not Included: Anything Else Not Mentioned Or Pictured )

Review JEOL Xray 1-4k Volt Scanning Electron Probe Microanalyzer

The JEOL JXA-840A Scanning Electron Probe Microanalyzer (SEM) is a high-performance instrument designed for advanced material characterization and analysis. With a resolution of 30 angstroms, this SEM offers unparalleled detail and precision, allowing for the examination of samples at an atomic level.

The JEOL JXA-840A is equipped with a 1-4kV electron beam, providing flexibility in analyzing a wide range of sample types, from conductive to non-conductive materials. The SEM features an energy-dispersive X-ray spectrometer (EDX) for elemental analysis, enabling the identification and quantification of elements within the sample. This combination of high resolution SEM and EDX capabilities makes the JXA-840A an indispensable tool for materials scientists, engineers, and researchers in various fields such as semiconductor manufacturing, mechanical engineering, materials science, and nanotechnology.

The JEOL JXA-840A SEM boasts a user-friendly interface, making it easy for both novice and experienced users to operate the system. The instrument also features advanced imaging techniques, such as backscattered electron imaging (BSE) and secondary electron imaging (SE), allowing for the creation of high-quality images with exceptional contrast and detail.

In summary, the JEOL JXA-840A Scanning Electron Probe Microanalyzer is a powerful and versatile instrument for material characterization and analysis. Its 30 angstrom resolution, 1-4kV electron beam, and advanced imaging capabilities make it an essential tool for researchers and professionals working in various fields requiring atomic-level analysis and characterization.

1. High Resolution: The 30-angstrom resolution enables detailed analysis of samples at the nanoscale, making it suitable for materials science research and development.

2. Wide Energy Range: The SEM-EDS instrument provides a wide energy range (1-4 kV) which allows for the analysis of various types of materials, including conductive and non-conductive samples.

3. Advanced EDS System: The JEOL JXA-840A comes with a state-of-the-art EDS system that provides excellent sensitivity and accuracy in elemental analysis.

4. Versatile: The instrument can be used for a variety of applications, such as failure analysis, material characterization, and research and development.

5. Reliable: JEOL is a well-known and reputable manufacturer of electron microscopes, and the JXA-840A is known for its high reliability and durability.

1. High Cost: The JEOL JXA-840A is a high-end instrument and can be quite expensive, making it a significant investment for most researchers.

2. Complex Operation: The instrument requires specialized training to operate and maintain, which can be a barrier for some users.

3. Limited Sample Size: The instrument can only analyze small samples, which can be a limitation for some applications.

4. Requires a Dedicated Lab Space: The instrument requires a dedicated lab space with specific environmental conditions, which can be a challenge for some organizations.

The JEOL JXA-840A X-ray Electron Probe Microanalyzer (SEM-EDS) is a high-performance instrument that offers excellent resolution, wide energy range, and advanced EDS capabilities. However, its high cost, complex operation, limited sample size, and requirement for dedicated lab space make it a significant investment.

If you have a dedicated materials research or development lab and have the budget, the JEOL JXA-840A is a great choice for high-resolution nanoscale analysis. However, if you have limited resources or need a more cost-effective solution, consider alternative SEM-EDS instruments with lower resolution and fewer capabilities, or consider alternative analytical techniques such as Energy-Dispersive X-ray Fluorescence (EDXRF) or Inductively Coupled Plasma Mass Spectrometry (ICP-MS).

Details:

All cover panels are included. Please bid accordingly as-is means: the item is sold where. Cosmetics: pictures are of actual item.

They were only removed for picture purposes.

There are no major dents or cracks visible in the unit. Testing: unit pulled from an updated clean laboratory.

Cables are in good conditions, and all tips complete show no wear or tear.

Please bid accordingly.

There are minor dents and scuffs from typical use.

part #: jxa840a prices

• $189.20-$15000.00

specifications analyticalinstrumentzo:

• brand: Jeol
• mpn: Jxa-840a
• part type: Probe
• not included: Anything Else Not Mentioned Or Pictured

Shipping analyticalinstrumentzo:

• type: Freight

Payments analyticalinstrumentzo:

• PayPal

Returns analyticalinstrumentzo:

• policy: no returns

General analyticalinstrumentzo:

• business industrial > healthcare life science lab equipment business industrial > analytical instruments lab equipment
• in stock: Yes
• condition: For parts or not working

Offer analyticalinstrumentzo:

• quantity: 1
• best offer: true
• Started: October 16, 2017, 9:19 am
• Sold: 0
• bids: 0

Ratings:

1. Excellent seller, AAA, packaged well, works great. 10-14-17
2. Thank you for the quick delivery! 10-16-17
3. Quick Delivery, Thank you! 10-16-17
4. Everything OK.5 10-16-17
5. Very nice with fast transaction and nice items. 10-14-17

Seller analyticalinstrumentzo:

• zipcode: 92806
• city: Anaheim, California

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